NDT of complex surface defects using photoacoustic method

Nippon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A

Volumn 63, Issue 608, 1997, Pages 870-876

  Endo, Haruo ^a   Hiwatashi, Yoichiro ^a   Hoshimiya, Tsutomu ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; MICROSCOPIC EXAMINATION; NONDESTRUCTIVE EXAMINATION;

COMPLEX SURFACE DEFECTS; PHOTOACOUSTIC MICROSCOPES;

SURFACE TESTING;

EID: 0031121245     PISSN: 03875008     EISSN: None     Source Type: Journal    
DOI: 10.1299/kikaia.63.870     Document Type: Article

References (7)