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Volumn 377-379, Issue , 1997, Pages 856-860
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Fe/Si(111) interface formation studied by photoelectron diffraction
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Author keywords
Iron; Metal semiconductor interfaces; Photoelectron diffraction; Photoelectron emission; Silicides; Silicon
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Indexed keywords
ANNEALING;
ATOMS;
DEPOSITION;
ELECTRON DIFFRACTION;
ELECTRON EMISSION;
ELECTRON ENERGY LEVELS;
IRON;
SEMICONDUCTOR METAL BOUNDARIES;
SILICON;
THERMAL EFFECTS;
PHOTOELECTRON DIFFRACTION;
PHOTOELECTRON EMISSION;
INTERFACES (MATERIALS);
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EID: 0031120783
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(96)01496-3 Document Type: Article |
Times cited : (16)
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References (22)
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