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Volumn 28, Issue 4, 1997, Pages 391-396

Joint effect of test effort and learning factor on software reliability and optimal release policy

Author keywords

[No Author keywords available]

Indexed keywords

ERROR DETECTION; NUMERICAL METHODS;

EID: 0031120540     PISSN: 00207721     EISSN: 14645319     Source Type: Journal    
DOI: 10.1080/00207729708929399     Document Type: Article
Times cited : (33)

References (9)
  • 1
    • 0022252694 scopus 로고
    • Software reliability models: Assumptions, limitations, & applications
    • Goel, A. L., 1985, Software reliability models: assumptions, limitations, & applications. IEEE Transactions on Software Engineering, 11, 1411-1423.
    • (1985) IEEE Transactions on Software Engineering , vol.11 , pp. 1411-1423
    • Goel, A.L.1
  • 2
    • 0018505572 scopus 로고
    • A time dependent error detection rate model for software reliability and other performance measures
    • Goel, A. L., and Okumoto, K., 1979, A time dependent error detection rate model for software reliability and other performance measures. IEEE Transactions on Reliability, 28, 206-211.
    • (1979) IEEE Transactions on Reliability , vol.28 , pp. 206-211
    • Goel, A.L.1    Okumoto, K.2
  • 3
    • 0019292406 scopus 로고
    • Optimal release time for software systems based on reliability and cost criteria
    • Okumoto, K., and Goel, A. L., 1980, Optimal release time for software systems based on reliability and cost criteria. Journal of Systems and Software, 1, 315-318.
    • (1980) Journal of Systems and Software , vol.1 , pp. 315-318
    • Okumoto, K.1    Goel, A.L.2
  • 4
    • 0022189422 scopus 로고
    • Cost-reliabilily optimal release policies for software systems
    • Yamada, S., and Osaki, S., 1985, Cost-reliabilily optimal release policies for software systems, IEEE Transactions on Reliability, 34, 422-424.
    • (1985) IEEE Transactions on Reliability , vol.34 , pp. 422-424
    • Yamada, S.1    Osaki, S.2
  • 5
    • 0027559945 scopus 로고
    • Software reliability growth with a Weibull tcst-cffort: A model application
    • Yamada, S., Hishitani, J., and Osaki, S., 1993, Software reliability growth with a Weibull tcst-cffort: a model application, IEEE Transactions on Reliability, 42, 100-105.
    • (1993) IEEE Transactions on Reliability , vol.42 , pp. 100-105
    • Yamada, S.1    Hishitani, J.2    Osaki, S.3
  • 6
    • 0021006179 scopus 로고
    • S-shaped reliability growth modeling for software error detection
    • Yamada, S., Ohba, M., and Osaki, S., 1983, S-shaped reliability growth modeling for software error detection. IEEE Transactions on Reliability, 32, 475-478
    • (1983) IEEE Transactions on Reliability , vol.32 , pp. 475-478
    • Yamada, S.1    Ohba, M.2    Osaki, S.3
  • 7
    • 0021506075 scopus 로고
    • S-shaped software reliability growth models and their applications
    • Yamada, S., Ohba, M., and Osaki, S., 1984, S-shaped software reliability growth models and their applications. IEEE Transactions on Reliability, 33, 289-291.
    • (1984) IEEE Transactions on Reliability , vol.33 , pp. 289-291
    • Yamada, S.1    Ohba, M.2    Osaki, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.