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Volumn 46, Issue 2, 1997, Pages 229-232

Optimized 1 V and 10 V josephson series arrays

Author keywords

Array; Josephson effect; Microwave circuit; Superconducting tunnel junction; Superconductivity; Voltage standard

Indexed keywords

CALIBRATION; MICROWAVE CIRCUITS; OPTIMIZATION; STANDARDS; SUPERCONDUCTIVITY; TUNNEL JUNCTIONS; VOLTAGE MEASUREMENT;

EID: 0031120442     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.571819     Document Type: Article
Times cited : (19)

References (9)
  • 4
    • 0029288150 scopus 로고
    • Performance and reliability of NIST 10 V Josephson arrays
    • Apr.
    • C. A. Hamilton and C. J. Burroughs, "Performance and reliability of NIST 10 V Josephson arrays," IEEE Trans. Instrum. Meas., vol. 44, pp. 238-240, Apr. 1995.
    • (1995) IEEE Trans. Instrum. Meas. , vol.44 , pp. 238-240
    • Hamilton, C.A.1    Burroughs, C.J.2
  • 6
    • 0026861159 scopus 로고
    • The Josephson effect and voltage standards
    • R. Pöpel, "The Josephson effect and voltage standards," Metrologia, vol. 29, pp. 153-174, 1992.
    • (1992) Metrologia , vol.29 , pp. 153-174
    • Pöpel, R.1
  • 8
    • 0024628366 scopus 로고
    • A new self aligning process for whole wafer tunnel junction fabrication
    • M. G. Blamire, J. E. Evetts, and D. G. Hasko, "A new self aligning process for whole wafer tunnel junction fabrication," IEEE Trans. Magn., vol. 25, pp. 1123-1126, 1989.
    • (1989) IEEE Trans. Magn. , vol.25 , pp. 1123-1126
    • Blamire, M.G.1    Evetts, J.E.2    Hasko, D.G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.