Interface dynamics and electromigration of the system Au-Ag/Si(111) using photoelectron emission microscopy

Surface Science

Volumn 377-379, Issue , 1997, Pages 969-974

  Kolmakov, A ^a   Bertolo, M ^a   Fontana, S ^a   Gunther S ^a   Kovac, J ^b   Marsi, M ^a   Kiskinova, M ^a  

^a SINCROTRONE TRIESTE   (Italy)

^b Institute of Surface Engineering and Optoelectronics Ljubljana   (Slovenia)

Author keywords

Au + Ag Si interface; Hetero adatoms; PEEM; Surface diffusion; Surface electromigration

Indexed keywords

ANNEALING; ELECTROMIGRATION; ELECTRONIC DENSITY OF STATES; GOLD; IMAGING TECHNIQUES; INTERFACES (MATERIALS); MASS TRANSFER; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING SILICON; SILVER; SURFACE PHENOMENA; THERMAL EFFECTS;

HETEROADATOMS; PHOTOELECTRON EMISSION MICROSCOPY (PEEM); REAL TIME IMAGING; SURFACE DIFFUSION;

BIMETALS;

EID: 0031120362     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01532-4     Document Type: Article

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