SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 81, Issue 8 PART 2B, 1997, Pages 5015-5017

Nonreciprocal differential detection method for scanning Kerr-effect microscopy

(2) Silva, T J a Kos, A B a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HARD DISK STORAGE; IMAGE ENHANCEMENT; IMAGING TECHNIQUES; LIGHT POLARIZATION; MAGNETIC DOMAINS; MAGNETIC FIELD EFFECTS; MAGNETIC RECORDING; MAGNETIZATION; METALLIC FILMS; NICKEL ALLOYS; OPTICAL MICROSCOPY;

DEFECT ANALYSIS; IMAGE ACQUISITION; MAGNETIC FORCE MICROSCOPY; NONRECIPROCAL DIFFERENTIAL DETECTION METHOD; PERMALLOY FILM; SCANNING KERR EFFECT MICROSCOPY;

KERR MAGNETOOPTICAL EFFECT;

EID: 0031120352 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.365550 Document Type: Article

Times cited : (12)

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