|
Volumn 388, Issue 3, 1997, Pages 289-296
|
Study of charge collection and noise in non-irradiated and irradiated silicon detectors
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ELECTRIC CHARGE;
ELECTRONS;
IRRADIATION;
RUTHENIUM;
SIGNAL DISTORTION;
SIGNAL TO NOISE RATIO;
SILICON;
SPURIOUS SIGNAL NOISE;
TEMPERATURE;
VOLTAGE MEASUREMENT;
CHARGE COLLECTION;
FLUENCE;
IONIZING ELECTRONS;
SHAPING TIME;
SILICON DETECTORS;
RADIATION DETECTORS;
|
EID: 0031120135
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(97)00004-1 Document Type: Article |
Times cited : (13)
|
References (6)
|