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Volumn 251, Issue 1-2, 1997, Pages 179-184

AC susceptibility measurements of films with different structural qualities

(8) Berling, D a Mehdaoui, A a Loegel, B a Leggieri, G b Luisa De Giorgi, M b Luches, A b Del Vecchio, A b,c Tapfer, L c

a UNIVERSITÉ DE HAUTE ALSACE (France)

b UNIVERSITY OF SALENTO (Italy)

c Centro Nazionale per la Ricerca e lo Sviluppo dei Materiali (Italy)

Author keywords

AC susceptibility measurements; Thin films

Indexed keywords

DEPOSITION; ELECTRIC FIELD EFFECTS; EPITAXIAL GROWTH; ERBIUM COMPOUNDS; HIGH TEMPERATURE SUPERCONDUCTORS; LASER ABLATION; MAGNETIC PERMEABILITY MEASUREMENT; OXIDE SUPERCONDUCTORS; SUBSTRATES; SUPERCONDUCTIVITY; X RAY DIFFRACTION ANALYSIS; ZIRCONIA;

REACTIVE LASER ABLATION; YTTRIA STABILIZED ZIRCONIA; YTTRIUM BARIUM COPPER OXIDES;

SUPERCONDUCTING FILMS;

EID: 0031119933 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/S0925-8388(96)02794-6 Document Type: Article

Times cited : (2)

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