XAFS study of the main constituent elements of layered aluminosilicates

Journal De Physique. IV : JP

Volumn 7, Issue 2 Part 2, 1997, Pages

  Castro, M A ^a   Alba, M D ^a   Alvero, R ^a   Becerro, A I ^a   Munoz Paez A ^a   Trillo, J M ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; X RAY SPECTROSCOPY;

PHYLLOSILICATES; X RAY ABSORPTION FINE STRUCTURE (XAFS) SPECTROSCOPY; X RAY ABSORPTION NEAR EDGE STRUCTURE (XANES) SPECTROSCOPY;

ZEOLITES;

EID: 0031119468     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:1997250     Document Type: Article

References (5)

1. Pauling, L., Proc.Natl.Acad.Sci.U.S. 16 (1930) 123-129.
2. Li D., Bancroft G.M., Fleet M.E., Feng X.H., Pan Y., Am.Mineral. 80 (1995) 432-440.
3. Li D., Bancroft G.M., Fleet M.E., Feng X.H., Phys.Chem.Minerals 22 (1995) 115-122.
4. Natoli C.R., EXAFS and Near Edge Structure.A. Bianconi, L. Incoccia Eds. (Springer Series on Chem. Phys., 1983) 27 p.43.
5. Li D., Bancroft G.M., Kasrai M., Fleet M.E., Secco R.A., Feng X.H., Tan K.H., Yang B.X., Am. Mineral. 79 (1994) 622-632.