A comparison of enhanced field emission from broad surfaces in direct-current and radiofrequency regimes

Journal of Physics D: Applied Physics

Volumn 30, Issue 8, 1997, Pages 1248-1251

  Luong, M ^a   Safa, H ^a   Bonin, B ^a   Junquera, T ^b   Le Goff, A ^b   Maissa S ^b  

^a CEA SACLAY   (France)

^b 91405 Orsay Campus   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; DEGASSING; DIODES; ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; ELECTRON MICROSCOPES; NIOBIUM;

ENHANCED ELECTRON FIELD EMISSION; FIELD EMITTERS; FOWLER-NORDHEIM PARAMETERS;

ELECTRON EMISSION;

EID: 0031119424     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/30/8/015     Document Type: Review

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