Linear and nonlinear FEL-SEW spectroscopic characterization of nanometer-thick films

Applied Spectroscopy

Volumn 51, Issue 4, 1997, Pages 584-591

  Alieva, E V ^a   Beitel, G ^b   Kuzik, L A ^a   Sigarev, A A ^c   Yakovlev, V A ^a   Zhizhin, G N ^a   Van Der Meer, A F G ^d   Van Der Wiel, M J ^d  

^a INSTITUTE OF SPECTROSCOPY   (Russian Federation)

^b SHELL RESEARCH AND TECHNOLOGY CENTRE   (Netherlands)

^c Zelenograd Research Institute of Physical Problems   (Russian Federation)

^d FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

Author keywords

Free electron laser; Infrared spectroscopy; Nonlinear spectroscopy; Optical constants; Surface electromagnetic waves; Surfaces; Thin films

Indexed keywords

ABSORPTION SPECTROSCOPY; ELECTROMAGNETIC WAVES; FREE ELECTRON LASERS; INFRARED SPECTROSCOPY; INTERFEROMETRY; LANGMUIR BLODGETT FILMS; METALLIC FILMS; METALS; OXIDES; PERMITTIVITY; PHONONS; SECOND HARMONIC GENERATION;

OPTICAL CONSTANTS; POLARITONS; SURFACE ELECTROMAGNETIC WAVES (SEW) SPECTROSCOPY; SURFACE PLASMONS;

SURFACE PHENOMENA;

EID: 0031119288     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702971940657     Document Type: Article

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