Full-pattern parametrization of two-dimensional wide-angle diffraction data from oriented polymers

Polymer

Volumn 38, Issue 9, 1997, Pages 2277-2280

  Murthy, N S ^a   Zero, K ^a  

^a HONEYWELL   (United States)

Author keywords

Full pattern analysis; Wide angle X ray diffraction

Indexed keywords

AMORPHOUS MATERIALS; CRYSTAL ORIENTATION; ELECTROMAGNETIC WAVE SCATTERING; PLASTIC FILAMENTS; X RAY CRYSTALLOGRAPHY;

WIDE ANGLE X RAY DIFFRACTION;

NYLON POLYMERS;

EID: 0031118801     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0032-3861(96)00946-9     Document Type: Article

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