Tin oxidation state, depth profiles of Sn2+ and Sn4+ and oxygen diffusivity in float glass by Mössbauer spectroscopy

Journal of Non-Crystalline Solids

Volumn 211, Issue 1-2, 1997, Pages 164-172

  Williams, K F E ^a   Johnson, C E ^a   Greengrass, J ^b   Tilley, B P ^b   Gelder, D ^b   Johnson, J A ^c  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

^b Pilkington Group Limited   (United Kingdom)

^c LIVERPOOL JOHN MOORES UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION IN SOLIDS; FUSED SILICA; HEAT TREATMENT; LOW TEMPERATURE EFFECTS; MOSSBAUER SPECTROSCOPY; POLISHING; SURFACE STRUCTURE; TIN;

DEBYE TEMPERATURE; DEPTH PROFILES; OXYGEN DIFFUSIVITY; SODA LIME SILICA FLOAT GLASS; TIN OXIDATION STATE;

PHOTOSENSITIVE GLASS;

EID: 0031118496     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(96)00636-9     Document Type: Article

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