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Volumn 29, Issue 3, 1997, Pages 195-211

Machine interference problem with warm spares, server vacations and exhaustive service

Author keywords

Finite source queues; Machine interference problem; Performance analysis; Vacation models; Warm spares

Indexed keywords

ALGORITHMS; MATHEMATICAL MODELS; PROBABILITY; PROBLEM SOLVING; QUEUEING THEORY; REPAIR;

EID: 0031118455     PISSN: 01665316     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0166-5316(96)00046-6     Document Type: Article
Times cited : (79)

References (7)
  • 1
    • 34250125289 scopus 로고
    • Queueing systems with vacations - A survey
    • B.T. Doshi, Queueing systems with vacations - A survey, Queueing Systems 1 (1986) 29-66.
    • (1986) Queueing Systems , vol.1 , pp. 29-66
    • Doshi, B.T.1
  • 3
    • 0028374648 scopus 로고
    • Interrelationship between queueing models with balking and reneging and machine repair problem with warm spares
    • S.M. Gupta, Interrelationship between queueing models with balking and reneging and machine repair problem with warm spares, Microelectronics and Reliability 34 (1994) 201-209.
    • (1994) Microelectronics and Reliability , vol.34 , pp. 201-209
    • Gupta, S.M.1
  • 4
    • 0009527154 scopus 로고
    • N-policy queueing system with finite population
    • S.M. Gupta, N-policy queueing system with finite population. Trans. Operational Research 7 (1995) 45-62.
    • (1995) Trans. Operational Research , vol.7 , pp. 45-62
    • Gupta, S.M.1
  • 5
    • 0009469245 scopus 로고
    • Stochastic Petri net analysis of finite population vacation queueing systems
    • O.C. Ibe and K.S. Trivedi, Stochastic Petri net analysis of finite population vacation queueing systems, Queueing Systems 8 (1991) 111-128.
    • (1991) Queueing Systems , vol.8 , pp. 111-128
    • Ibe, O.C.1    Trivedi, K.S.2
  • 7
    • 0024878188 scopus 로고
    • Economic analysis of the M/M/R machine repair problem and warm standbys
    • B.D. Sivazlian and K.H. Wang, Economic analysis of the M/M/R machine repair problem and warm standbys, Microelectronics and Reliability 29 (1989) 25-35.
    • (1989) Microelectronics and Reliability , vol.29 , pp. 25-35
    • Sivazlian, B.D.1    Wang, K.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.