A new refractometer by combining a variable length vacuum cell and a double-pass michelson interferometer

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 2, 1997, Pages 191-195

  Fujii, Ken Ichi ^a,b   Williams, E R ^b   Steiner, R L ^b   Newell, D B ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Dark fringe; Interferometer; Phase modulation interferometry; Refractive index of air; Refractometer; SI watt experiment

Indexed keywords

AIR; INTERFEROMETERS; LIGHT MEASUREMENT; LIGHT MODULATION; PHASE MODULATION; REFRACTIVE INDEX; STANDARDS;

MICHELSON INTERFEROMETERS; PHASE MODULATION INTERFEROMETRY; VACUUM ELLS;

REFRACTOMETERS;

EID: 0031117707     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.571809     Document Type: Article

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