The molar volume of silicon

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 2, 1997, Pages 592-595

  De Bièvre, Paul ^a   Valkiers, Staf ^a   Gonfiantini, Roberto ^a   Taylor, Philip D P ^a   Bettin, Horst ^b   Spieweck, Frank ^b   Peuto, Anna ^c   Pettorruso, Savino ^c   Mosca, Mario ^c   Fujii, Ken Ichi ^d   Tanaka, Mitsuru ^d   Nezu, Yoshiaki ^d   Leistner, Achim J ^e   Giardini, Walter J ^e  

^a JOINT RESEARCH CENTRE   (Italy)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^c Istituto di Metrologia Gustavo Colonnetti   (Italy)

^d NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^e CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL SYMMETRY; CRYSTALLOGRAPHY; DENSITY MEASUREMENT (SPECIFIC GRAVITY); SINGLE CRYSTALS;

AVOGADRO'S CONSTANT; MOLAR VOLUME;

SILICON;

EID: 0031117648     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.571927     Document Type: Article

References (15)

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