Photosensitivity of silicon-porous silicon heterostructures

Thin Solid Films

Volumn 297, Issue 1-2, 1997, Pages 129-131

  Astrova, E V ^a   Lebedev, A A ^a   Remenyuk, A D ^a   Rud', V Yu ^b   Rud', Yu V ^a  

^a IOFFE INSTITUTE   (Russian Federation)

^b PETER THE GREAT ST PETERSBURG POLYTECHNIC UNIVERSITY   (Russian Federation)

Author keywords

Heterostructure; Photosensitivity oscillations; Polarization; Porous silicon

Indexed keywords

LIGHT INTERFERENCE; OPTICAL VARIABLES MEASUREMENT; PHOTOCONDUCTIVITY; PHOTOLUMINESCENCE; PHOTOSENSITIVITY; POLARIZATION; POROUS SILICON; REFRACTIVE INDEX; SEMICONDUCTING SILICON;

LIGHT INCIDENCE; PHOTOCURRENT INTENSITY; PHOTOSENSITIVITY OSCILLATIONS;

HETEROJUNCTIONS;

EID: 0031117592     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09531-4     Document Type: Article

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