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Volumn 377-379, Issue , 1997, Pages 215-219

Electronic properties of (2 × n)-Bi reconstructions on Si(100)

Author keywords

Surface electronic phenomena

Indexed keywords

ANNEALING; CHEMICAL MODIFICATION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC DENSITY OF STATES; ELECTRONIC STRUCTURE; ENERGY GAP; METALLIC FILMS; PHOTOEMISSION; SEMICONDUCTING SILICON; SURFACE PHENOMENA; SURFACE STRUCTURE; SURFACE TREATMENT;

EID: 0031117439     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01357-X     Document Type: Article
Times cited : (5)

References (20)
  • 18
    • 0041675717 scopus 로고
    • A.B. McLean and F.J. Himpsel, Phys. Rev. B 40 (1989) 8425; T. Guo, R.E. Atkinson and W.K. Ford, Phys. Rev. B 41 (1990) 5138.
    • (1989) Phys. Rev. B , vol.40 , pp. 8425
    • McLean, A.B.1    Himpsel, F.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.