Effects of thickness and deposition rate on the optical absorption properties of co-evaporated Mn/SiOx, Cr/SiOx and Cu/SiOx thin films

Journal of Materials Science Letters

Volumn 16, Issue 8, 1997, Pages 608-610

  Zaidi, S Z A ^a   Beynon, J ^a  

^a BRUNEL UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; DEPOSITION; ELECTRIC CONDUCTIVITY OF SOLIDS; ENERGY GAP; LIGHT ABSORPTION; LIGHT VELOCITY; METALLIC FILMS; REFRACTIVE INDEX; THICKNESS CONTROL; X RAY PHOTOELECTRON SPECTROSCOPY;

SINGLE BOAT DEPOSITION; SOFTWARE PACKAGE PECSS; THICKNESS EFFECTS;

THIN FILMS;

EID: 0031117177     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018594628103     Document Type: Article

References (11)

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