The philosophy of microscopic quantification

Materials Characterization

Volumn 38, Issue 4-5, 1997, Pages 217-227

  Ralph, Brian ^a   Kurzydlowski K J ^b  

^a BRUNEL UNIVERSITY   (United Kingdom)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; GRAIN BOUNDARIES; PHASE INTERFACES; TEXTURES;

CLUSTERS; MICROSCOPIC QUANTIFICATION;

MICROSTRUCTURE;

EID: 0031108923     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/s1044-5803(97)00051-x     Document Type: Article

References (31)

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