Reliability study on 50-100-mW CW operation of 680-nm visible laser diodes with a window-mirror structure

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 3, Issue 2, 1997, Pages 443-449

  Shima, Akihiro ^a,b,c,d   Tada, Hitoshi ^a   Motoda, Takashi ^a,e,f   Tsugami, Mari ^a   Utakouji, Takeshi ^a   Higuchi, Hideyo ^a  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

^b IEEE   (Japan)

^c NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^d Optoelectron Microwave Devices Lab   (Japan)

^e SOPHIA UNIVERSITY   (Japan)

^f JAPAN SOCIETY OF APPLIED PHYSICS   (Japan)

Author keywords

CW lasers; Diffusion processes; Disk recording; Nuability; Semiconductor lasers

Indexed keywords

CONTINUOUS WAVE LASERS; CURRENT DENSITY; DEGRADATION; LIGHT REFLECTION; MIRRORS; RELIABILITY; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR QUANTUM WELLS; THERMAL EFFECTS;

DISK RECORDING; OPTICAL POWER DENSITY;

SEMICONDUCTOR LASERS;

EID: 0031108483     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/2944.605691     Document Type: Article

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