메뉴 건너뛰기




Volumn 8, Issue 3, 1997, Pages 275-282

Effect of the long-range potential on ion mobility measurements

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ELEMENTARY PARTICLE; ION TRANSPORT; MASS SPECTROMETRY; MATHEMATICAL COMPUTING; MOLECULAR INTERACTION; TEMPERATURE SENSITIVITY;

EID: 0031106850     PISSN: 10440305     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-0305(96)00236-X     Document Type: Article
Times cited : (323)

References (34)
  • 1
    • 85186823703 scopus 로고
    • University of California Press: Berkeley, CA
    • 1. Loeb, L. B. Basic Processes of Gaseous Electronics; University of California Press: Berkeley, CA, 1960; Massey, H. S. W. Electronic and Ionic Impact Phenomena, Vol. II; Clarendon: Oxford, 1969; McDaniel, E. W.; Mason, E. A. The Mobility and Diffusion of Ions in Gases; Wiley: New York, 1973; Mason, E. A.; McDaniel, E. W. Transport Properties of Ions in Gases; Wiley: New York, 1988.
    • (1960) Basic Processes of Gaseous Electronics
    • Loeb, L.B.1
  • 2
    • 0003773062 scopus 로고
    • Clarendon: Oxford
    • 1. Loeb, L. B. Basic Processes of Gaseous Electronics; University of California Press: Berkeley, CA, 1960; Massey, H. S. W. Electronic and Ionic Impact Phenomena, Vol. II; Clarendon: Oxford, 1969; McDaniel, E. W.; Mason, E. A. The Mobility and Diffusion of Ions in Gases; Wiley: New York, 1973; Mason, E. A.; McDaniel, E. W. Transport Properties of Ions in Gases; Wiley: New York, 1988.
    • (1969) Electronic and Ionic Impact Phenomena , vol.2
    • Massey, H.S.W.1
  • 3
    • 0004094138 scopus 로고
    • Wiley: New York
    • 1. Loeb, L. B. Basic Processes of Gaseous Electronics; University of California Press: Berkeley, CA, 1960; Massey, H. S. W. Electronic and Ionic Impact Phenomena, Vol. II; Clarendon: Oxford, 1969; McDaniel, E. W.; Mason, E. A. The Mobility and Diffusion of Ions in Gases; Wiley: New York, 1973; Mason, E. A.; McDaniel, E. W. Transport Properties of Ions in Gases; Wiley: New York, 1988.
    • (1973) The Mobility and Diffusion of Ions in Gases
    • McDaniel, E.W.1    Mason, E.A.2
  • 4
    • 0003442934 scopus 로고
    • Wiley: New York
    • 1. Loeb, L. B. Basic Processes of Gaseous Electronics; University of California Press: Berkeley, CA, 1960; Massey, H. S. W. Electronic and Ionic Impact Phenomena, Vol. II; Clarendon: Oxford, 1969; McDaniel, E. W.; Mason, E. A. The Mobility and Diffusion of Ions in Gases; Wiley: New York, 1973; Mason, E. A.; McDaniel, E. W. Transport Properties of Ions in Gases; Wiley: New York, 1988.
    • (1988) Transport Properties of Ions in Gases
    • Mason, E.A.1    McDaniel, E.W.2
  • 5
    • 0025582389 scopus 로고
    • 2. Hill, H. H., Jr.; Siems, W. F.; St. Louis, R. H.; McMinn, D. G. Anal. Chem. 1990, 62, 1201; St. Louis, R. H.; Hill, H. H. Crit. Rev. Anal. Chem. 1990, 21, 321; Eiceman, G. A. Rev. Anal. Chem. 1991, 22, 471; Karpas, Z. Forensic Sci. Rev. 1990, 1, 103.
    • (1990) Anal. Chem. , vol.62 , pp. 1201
    • Hill H.H., Jr.1    Siems, W.F.2    St Louis, R.H.3    McMinn, D.G.4
  • 6
    • 80051751860 scopus 로고
    • 2. Hill, H. H., Jr.; Siems, W. F.; St. Louis, R. H.; McMinn, D. G. Anal. Chem. 1990, 62, 1201; St. Louis, R. H.; Hill, H. H. Crit. Rev. Anal. Chem. 1990, 21, 321; Eiceman, G. A. Rev. Anal. Chem. 1991, 22, 471; Karpas, Z. Forensic Sci. Rev. 1990, 1, 103.
    • (1990) Crit. Rev. Anal. Chem. , vol.21 , pp. 321
    • St Louis, R.H.1    Hill, H.H.2
  • 7
    • 84963444786 scopus 로고
    • 2. Hill, H. H., Jr.; Siems, W. F.; St. Louis, R. H.; McMinn, D. G. Anal. Chem. 1990, 62, 1201; St. Louis, R. H.; Hill, H. H. Crit. Rev. Anal. Chem. 1990, 21, 321; Eiceman, G. A. Rev. Anal. Chem. 1991, 22, 471; Karpas, Z. Forensic Sci. Rev. 1990, 1, 103.
    • (1991) Rev. Anal. Chem. , vol.22 , pp. 471
    • Eiceman, G.A.1
  • 8
    • 0000976797 scopus 로고
    • 2. Hill, H. H., Jr.; Siems, W. F.; St. Louis, R. H.; McMinn, D. G. Anal. Chem. 1990, 62, 1201; St. Louis, R. H.; Hill, H. H. Crit. Rev. Anal. Chem. 1990, 21, 321; Eiceman, G. A. Rev. Anal. Chem. 1991, 22, 471; Karpas, Z. Forensic Sci. Rev. 1990, 1, 103.
    • (1990) Forensic Sci. Rev. , vol.1 , pp. 103
    • Karpas, Z.1
  • 9
    • 0000845416 scopus 로고
    • 3. Kemper, P. R.; Bowers, M. T. J. Phys. Chem. 1991, 95, 5134; van Koppen, P. A. M.; Kemper, P. R.; Bowers, M. T. J. Am. Chem. Soc. 1993, 115, 5616.
    • (1991) J. Phys. Chem. , vol.95 , pp. 5134
    • Kemper, P.R.1    Bowers, M.T.2
  • 16
    • 0000105729 scopus 로고
    • 8. von Helden, G.; Kemper, P. R.; Gotts, N. G.; Bowers, M. T. Science 1993, 259, 1300; Gotts, N. G.; von Helden, G.; Bowers, M. T. Int. J. Mass Spectrom. Ion Processes, 1995, 150, 217.
    • (1993) Science , vol.259 , pp. 1300
    • Von Helden, G.1    Kemper, P.R.2    Gotts, N.G.3    Bowers, M.T.4
  • 25
    • 0029246743 scopus 로고
    • 14. von Helden, G.; Gotts, N. G.; Maitre, P.; Bowers, M. T. Chem. Phys. Lett. 1994, 227, 601; Lee, S.; Gotts, N. G.; von Helden, G., Bowers, M. T. Science 1995, 267, 999.
    • (1995) Science , vol.267 , pp. 999
    • Lee, S.1    Gotts, N.G.2    Von Helden, G.3    Bowers, M.T.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.