In-plane Electronic Speckle Pattern Shearing Interferometry

Optics and Lasers in Engineering

Volumn 26, Issue 4-5 SPEC. ISS., 1997, Pages 395-406

  Tyrer, J R ^a   Petzing, J N ^a  

^a LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; CRACKS; FINITE ELEMENT METHOD; INTERFEROMETERS; LIGHTING; MATHEMATICAL MODELS; OPTICAL CORRELATION; SPECKLE; STRAIN; STRESSES;

ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; FINITE ELEMENT SOFTWARE PREDICTION; IN PLANE PARTIAL DERIVATIVES; OPTICAL INTENSITY;

INTERFEROMETRY;

EID: 0031104420     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/0143-8166(95)00139-5     Document Type: Article

References (6)

1. Leendertz, J. A. & Butters, J. N., An image-shearing speckle-pattern interferometer for measuring bending moments. J. Phys. E: Sci. Inst., 6 (1973) 1107-10.
2. Hung, Y. Y., A speckle shearing interferometer: A tool for measuring derivatives of surface displacements. Optics Commun., 11 (1974) 132-5.
3. Hung, Y. Y. & Durelli, A. J., Simultaneous measurement of three displacement derivatives using a multiple image-shearing interferometric camera. J. Strain Analysis, 14 (1979) 81-8.
4. Hung, Y. Y. & Liang, C. Y., Image-shearing camera for direct measurement of surface strains. Appl. Opt., 18 (1979) 1046-51.
5. Ng, T. W. & Chau, F. S., Statistical properties of phase variation in shearing speckle interferometry and its effect on fringe visibility. J. Modern Optics, 39(12) (1992) 2463-9.
6. Moore, A. J. & Tyrer, J. R., The evaluation of fracture mechanics parameters from electronic speckle pattern interferometric fringe patterns. Optics Lasers Engng, 19 (1993) 325-36.