Interfacial observations of Ni/Ni3Si and Ni/Ni3Ga diffusion couples

Philosophical Magazine Letters

Volumn 75, Issue 3, 1997, Pages 149-153

  Horita, Z ^a   Fujiwara, K ^a   Ootoshi, Y ^a   Komai, N ^a,b   Watanabe, M ^a,c   Nemoto, M ^a  

^a KYUSHU UNIVERSITY   (Japan)

^b MITSUBISHI HEAVY INDUSTRIES LTD   (Japan)

^c Lehigh University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; INTERFACES (MATERIALS); INTERMETALLICS; SPECIMEN PREPARATION; TRANSMISSION ELECTRON MICROSCOPY;

DIFFUSION COUPLES; FOCUSED ION BEAM CUTTING TECHNIQUE;

NICKEL ALLOYS;

EID: 0031104334     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008397179705     Document Type: Article

References (5)

1. Dupeux, M., Rouault-Rogez, H., and Willemin, P., 1988, Materials Research Society Symposium Proceedings, Vol. 122 (Pittsburgh, Pennsylvania: Materials Research Society), p. 169.
2. Kawazoe, H., Takasugi, T., and Izumi, O., 1982, J. Mater. Sci., 17, 1303.
3. Kitano, Y., Fujikawa, Y., Kamino, T., Yaguchi, T., and Saka, H., 1995, J. Electron Microsc, 44, 410.
4. Komai, N., Watanabe M., and Horita, Z., 1995, Acta metall. mater., 43, 2967.
5. Watanabe, M., Horita, Z., Smith, D. J., McCartney, M. R., Sano, T., and Nemoto, M., 1994, Acta metall. mater., 42, 3381.