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Volumn 89, Issue 3, 1997, Pages 233-238

Substrate and coating damage by arcing during sputtering

Author keywords

Arcing; Coating defects; Coatings; PVD processes; Sputtering

Indexed keywords

ARGON; DEFECTS; ELECTRIC ARCS; ELECTRIC TRANSFORMERS; ETCHING; GLOW DISCHARGES; IMAGE ANALYSIS; OPTICAL MICROSCOPY; OPTIMIZATION; PRESSURE EFFECTS; SPUTTER DEPOSITION; SURFACE PROPERTIES;

EID: 0031104091     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(96)02908-8     Document Type: Article
Times cited : (29)

References (18)
  • 11
    • 85033118520 scopus 로고    scopus 로고
    • European Patent EP 0 383 962 A1, 8 August, 1990
    • R. Tietema, European Patent EP 0 383 962 A1, 8 August, 1990.
    • Tietema, R.1
  • 16
    • 0043220608 scopus 로고
    • J.L. Vossen and W. Kern (Eds.), Academic Press, San Diego, CA
    • S.M. Rossnagel, in J.L. Vossen and W. Kern (Eds.), Thin Film Processes II, Academic Press, San Diego, CA, 1991, p. 22.
    • (1991) Thin Film Processes , vol.2 , pp. 22
    • Rossnagel, S.M.1
  • 18
    • 0043220602 scopus 로고
    • J.L. Vossen and W. Kern (Eds.), Academic Press, San Diego, CA
    • P.C. Johnson, in J.L. Vossen and W. Kern (Eds.), Thin Film Processes II, Academic Press, San Diego, CA, 1991, p. 229.
    • (1991) Thin Film Processes , vol.2 , pp. 229
    • Johnson, P.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.