Notes on the Application of Electronic Speckle Pattern Interferometry

Optics and Lasers in Engineering

Volumn 26, Issue 4-5 SPEC. ISS., 1997, Pages 283-299

  Ritter, R ^a   Galanulis, K ^a   Winter, D ^b   Muller E ^c   Breuckmann, B ^d  

^a TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

^b Society for Optical Measurement GmbH   (Germany)

^c Newport Instruments AG   (Switzerland)

^d Breuckmann GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FIBER OPTICS; FINITE ELEMENT METHOD; IMAGE PROCESSING; MATERIALS TESTING; MATHEMATICAL MODELS; OPTICAL VARIABLES MEASUREMENT; OPTOELECTRONIC DEVICES; QUALITY CONTROL; SEMICONDUCTOR LASERS; SPECKLE; VIBRATION MEASUREMENT;

CCD CAMERA; DEFORMATION MEASUREMENT; DISPLACEMENT MEASUREMENT; ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; GREY CODE; MICHELSON INTERFEROMETER;

INTERFEROMETRY;

EID: 0031103709     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/0143-8166(95)00134-4     Document Type: Article

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