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Volumn 32, Issue 5, 1997, Pages 1163-1167
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A Raman and photoconductivity analysis of boron-doped SiC: H films deposited using the electron cyclotron resonance method
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Author keywords
[No Author keywords available]
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Indexed keywords
BORON;
CHEMICAL VAPOR DEPOSITION;
DOPING (ADDITIVES);
ELECTRON CYCLOTRON RESONANCE;
HYDROGEN;
METHANE;
MICROWAVES;
PHOTOCONDUCTIVITY;
RAMAN SCATTERING;
SILANES;
SILICON CARBIDE;
DARK CONDUCTIVITY;
DIBORANE;
HYDROGENATED AMORPHOUS SILICON CARBIDE FILMS;
MICROWAVE POWER;
AMORPHOUS FILMS;
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EID: 0031103158
PISSN: 00222461
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1018571615654 Document Type: Article |
Times cited : (1)
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References (12)
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