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Volumn 32, Issue 5, 1997, Pages 1163-1167

A Raman and photoconductivity analysis of boron-doped SiC: H films deposited using the electron cyclotron resonance method

Author keywords

[No Author keywords available]

Indexed keywords

BORON; CHEMICAL VAPOR DEPOSITION; DOPING (ADDITIVES); ELECTRON CYCLOTRON RESONANCE; HYDROGEN; METHANE; MICROWAVES; PHOTOCONDUCTIVITY; RAMAN SCATTERING; SILANES; SILICON CARBIDE;

EID: 0031103158     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018571615654     Document Type: Article
Times cited : (1)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.