Methods for liquid-solid interface shape and location discrimination during eddy current sensing of Bridgman growth

Journal of Crystal Growth

Volumn 172, Issue 3-4, 1997, Pages 313-322

  Wadley, Haydn N G ^a   Dharmasena, Kumar P ^a  

^a University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CHARACTERIZATION; COMPUTER SIMULATION; EDDY CURRENT TESTING; ELECTRIC IMPEDANCE; FINITE ELEMENT METHOD; INTERFACES (MATERIALS); SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SENSORS;

BRIDGMAN GROWTH; EDDY CURRENT SENSING; IMAGINARY IMPEDANCE;

SEMICONDUCTOR GROWTH;

EID: 0031103091     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)00496-4     Document Type: Article

References (10)

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