Long-run availability of a repairable parallel system

Microelectronics Reliability

Volumn 37, Issue 3, 1997, Pages 525-527

  Vanderperre, E J ^a   Makhanov, S S ^a   Suchatvejapoom, Sunthorn ^a  

^a KING MONGKUT'S INSTITUTE OF TECHNOLOGY LADKRABANG   (Thailand)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AVAILABILITY; COMPUTER GRAPHICS; FAILURE ANALYSIS; INDUSTRIAL PLANTS; ITERATIVE METHODS; PARTIAL DIFFERENTIAL EQUATIONS; RANDOM PROCESSES; REPAIR; WEIBULL DISTRIBUTION;

LONG RUN AVAILABILITY; TWO UNIT PARALLEL SYSTEM;

RELIABILITY;

EID: 0031103040     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/0026-2714(95)00071-2     Document Type: Article

References (13)

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