메뉴 건너뛰기




Volumn 9, Issue 3, 1997, Pages 300-302

Optimized single-layer antireflection coatings for semiconductor lasers

Author keywords

Antireflection coating; Facet coating

Indexed keywords

ANTIREFLECTION COATINGS; BOUNDARY CONDITIONS; CALCULATIONS; CLADDING (COATING); DIELECTRIC WAVEGUIDES; LIGHT REFLECTION; OPTIMIZATION; QUANTUM WELL LASERS; SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0031102996     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.556053     Document Type: Article
Times cited : (7)

References (14)
  • 1
    • 0027259633 scopus 로고
    • Modeling broad-area semiconductor optical amplifiers
    • Jan.
    • G. C. Dente and M. L. Tilton, "Modeling broad-area semiconductor optical amplifiers," IEEE J. Quantum Electron., vol. 29, pp. 76-88, Jan. 1993.
    • (1993) IEEE J. Quantum Electron. , vol.29 , pp. 76-88
    • Dente, G.C.1    Tilton, M.L.2
  • 2
    • 0024611740 scopus 로고
    • Single-layer antireflection coating of semiconductor lasers: Polarization properties and the influence of the laser structure
    • Feb.
    • L. Alternas and L. Thylen, "Single-layer antireflection coating of semiconductor lasers: polarization properties and the influence of the laser structure," J. Lightwave Technol., vol. 7, pp. 426-430, Feb. 1989.
    • (1989) J. Lightwave Technol. , vol.7 , pp. 426-430
    • Alternas, L.1    Thylen, L.2
  • 4
    • 0026852948 scopus 로고
    • Optimal AR-coating for optical waveguide devices
    • Apr.
    • W. Hellmich and P.P. Deimel, "Optimal AR-coating for optical waveguide devices," J. Lightwave Technol., vol. 10, pp. 469-476, Apr. 1992.
    • (1992) J. Lightwave Technol. , vol.10 , pp. 469-476
    • Hellmich, W.1    Deimel, P.P.2
  • 6
    • 0025471735 scopus 로고
    • Theory and practical calculation of antireflection coatings on semiconductor laser diode optical amplifiers
    • Aug.
    • C. Vassallo, "Theory and practical calculation of antireflection coatings on semiconductor laser diode optical amplifiers," Proc. Inst. Elect. Eng., vol. 137, pt. J. no. 4, pp. 193-202, Aug. 1990.
    • (1990) Proc. Inst. Elect. Eng. , vol.137 , Issue.4 PART J , pp. 193-202
    • Vassallo, C.1
  • 7
    • 0015354762 scopus 로고
    • Reflectivity of mode at facet and oscillation mode in double-heterostructure injection lasers
    • QE-8, Jun.
    • T. Ikegami, "Reflectivity of mode at facet and oscillation mode in double-heterostructure injection lasers," IEEE J. Quantum Electron., QE-8, pp. 470-476, Jun. 1972.
    • (1972) IEEE J. Quantum Electron. , pp. 470-476
    • Ikegami, T.1
  • 10
    • 0030104883 scopus 로고    scopus 로고
    • Gain, refractive index, and α-parameter in InGaAs-GaAs SQW broad-area lasers
    • Mar.
    • D. J. Bossert and D. Gallant, "Gain, refractive index, and α-parameter in InGaAs-GaAs SQW broad-area lasers," IEEE Photon. Technol. Lett., vol. 8, pp. 322-324, Mar. 1996.
    • (1996) IEEE Photon. Technol. Lett. , vol.8 , pp. 322-324
    • Bossert, D.J.1    Gallant, D.2
  • 12
    • 0015667898 scopus 로고
    • CW degradation at 300 K of GaAs double-heterostructure junction lasers. II. Electronic gain
    • B. W. Hakki and T. L. Paoli, "CW degradation at 300 K of GaAs double-heterostructure junction lasers. II. Electronic gain," J. Appl. Phys., vol. 44, pp. 4113-4119, 1973.
    • (1973) J. Appl. Phys. , vol.44 , pp. 4113-4119
    • Hakki, B.W.1    Paoli, T.L.2
  • 13
    • 0027694363 scopus 로고
    • Determination of wavelength dependence of the reflectivity at AR coated diode facets
    • Nov.
    • B. Luo, L. Wu, J. Chen, and Y. Lu, "Determination of wavelength dependence of the reflectivity at AR coated diode facets," IEEE Photon. Technol. Lett., vol. 5, pp. 1279-1281, Nov. 1993.
    • (1993) IEEE Photon. Technol. Lett. , vol.5 , pp. 1279-1281
    • Luo, B.1    Wu, L.2    Chen, J.3    Lu, Y.4
  • 14
    • 0030081405 scopus 로고    scopus 로고
    • Improved method for gain/index measurements of semiconductor lasers
    • Feb.
    • D. J. Bossert and D. Gallant, "Improved method for gain/index measurements of semiconductor lasers," Electron. Lett., vol. 32, no. 4, pp. 338-339, Feb. 1996.
    • (1996) Electron. Lett. , vol.32 , Issue.4 , pp. 338-339
    • Bossert, D.J.1    Gallant, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.