Punchthrough currents in sub-micron short channel MOS transistors

Solid-State Electronics

Volumn 41, Issue 3, 1997, Pages 435-439

  Fu, Kuan Yu ^a   Tsang, Yuk L ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; DIFFUSION IN SOLIDS; ELECTRIC SPACE CHARGE;

DRAIN INDUCED BARRIER LOWERING (DIBL); PUNCHTHROUGH CURRENTS; SURFACE DIFFUSION CURRENT;

MOSFET DEVICES;

EID: 0031102928     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(96)00103-7     Document Type: Article

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