Fine structure in differential conductance of oxidized nickel observed in a room temperature STM experiment

Solid State Communications

Volumn 101, Issue 12, 1997, Pages 877-882

  Olejniczak, W ^a   Bieniecki, M ^a  

^a UNIVERSITY OF LODZ   (Poland)

Author keywords

C. scanning tunnelling microscopy; D. electron phonon interactions; D. tunnelling

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; OXIDATION; PHONONS; POLYCRYSTALLINE MATERIALS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR DEVICE STRUCTURES;

MESOSCOPIC DYNAMIC PROCESSES;

NICKEL;

EID: 0031102725     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(96)00752-1     Document Type: Article

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