Preparation by glancing incidence ion irradiation of CaF2 surfaces with ångstrom-scale RMS roughness

Nanotechnology

Volumn 8, Issue 1, 1997, Pages 40-45

  Wissing M ^a   Batzill, M ^a   Snowdon, K J ^a  

^a NEWCASTLE UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; IONS; IRRADIATION; MORPHOLOGY; OPTICAL RESOLVING POWER; RADIATION EFFECTS; SPUTTERING; SURFACE ROUGHNESS;

ROOT MEAN SQUARE (RMS);

CALCIUM COMPOUNDS;

EID: 0031102599     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/8/1/010     Document Type: Article

References (13)

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