IC codes inspection by similarity matching technique

International Journal of Industrial Engineering : Theory Applications and Practice

Volumn 4, Issue 1, 1997, Pages 34-41

  Wang, Mao Jiun J ^a   Wu, Wen Yen ^b   Liu, Cheng Jen ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b Kaohsiung Polytechnic Institute Taiwan   (Taiwan)

Author keywords

Feature selection; IC codess; Inspection; Recognition; Similarity matching

Indexed keywords

CODES (SYMBOLS); COMPUTER SIMULATION; FEATURE EXTRACTION; INSPECTION; INTEGRATED CIRCUITS; STATISTICAL METHODS; VECTORS;

FEATURE SELECTION; INTEGRATED CIRCUIT CODES; SIMILARITY MATCHING; STATISTICAL PATTERN RECOGNITION;

CHARACTER RECOGNITION;

EID: 0031102463     PISSN: 10724761     EISSN: 1943670X     Source Type: Journal    
DOI: None     Document Type: Article

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