Resolution enhancement by extrapolation of the optically measured spectrum of surface profiles

Applied Optics

Volumn 36, Issue 8, 1997, Pages 1747-1751

  Friedmann, Michael ^a   Shamir, Joseph ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; DIFFRACTION; FOURIER TRANSFORMS; FREQUENCIES; OPTICAL SYSTEMS; PIEZOELECTRIC TRANSDUCERS; SURFACES;

GABOR EXPANSION; GAUSSIAN BEAMS; SHORT TIME FOURIER TRANSFORMS; SLIDING WINDOW SPECTRUM;

SPECTRUM ANALYSIS;

EID: 0031102278     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.001747     Document Type: Article

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