Anomalous electrical characteristics of epitaxial InN films having a high electron concentration at very low temperature

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 36, Issue 3 A, 1997, Pages

  Miura, Naruhisa ^a   Ishii, Hideaki ^a   Yamada, Akira ^a   Konagai, Makoto ^a   Yamauchi, Yasuyuki ^a   Yamamoto, Akio ^a  

^a Tokyo Inst of Technology ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC RESISTANCE; EPITAXIAL GROWTH; FILM GROWTH; LOW TEMPERATURE EFFECTS; MAGNETIC FIELD EFFECTS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING INDIUM COMPOUNDS; THIN FILMS;

INDIUM NITRIDE FILMS; X RAY ROCKING CURVES;

SEMICONDUCTING FILMS;

EID: 0031101673     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.l256     Document Type: Article

References (12)