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Volumn 33, Issue 2, 1997, Pages 435-443

Noninvasive optoelectronic system for measurement of electrostatic discharge (ESD)-induced phenomena

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELD MEASUREMENT; ELECTROMAGNETIC WAVE INTERFERENCE; FIBER OPTICS; OPTICAL LINKS; OPTOELECTRONIC DEVICES; RADIATION DETECTORS; SIGNAL RECEIVERS; TRANSMITTERS;

EID: 0031101357     PISSN: 00939994     EISSN: None     Source Type: Journal    
DOI: 10.1109/28.568007     Document Type: Article
Times cited : (4)

References (51)
  • 12
    • 35848937238 scopus 로고    scopus 로고
    • "Electromagnetic compatibility for industrial process measurement and control equipment-Part 2: Electrostatic discharge requirements,"
    • "Electromagnetic compatibility for industrial process measurement and control equipment-Part 2: Electrostatic discharge requirements," International Electrotechnical Commission, Geneva, Switzerland, IEC 801-2-1991.
    • International Electrotechnical Commission, Geneva, Switzerland, IEC 801-2-1991.
  • 18
    • 0024056425 scopus 로고    scopus 로고
    • "Techniques for measuring the electromagnetic shielding effectiveness of materials, part II: Near-field source simulation,"
    • P. F. Wilson and M. T. Ma, "Techniques for measuring the electromagnetic shielding effectiveness of materials, part II: Near-field source simulation," IEEE Trans. Electromag. Compat., vol. 30, pp. 251-259, Aug. 1988.
    • IEEE Trans. Electromag. Compat., Vol. 30, Pp. 251-259, Aug. 1988.
    • Wilson, P.F.1    Ma, M.T.2
  • 21
    • 0024107848 scopus 로고    scopus 로고
    • "An optically linked electric and magnetic field sensor for poynting vector measurements in the near-fields of radiating sources,"
    • L. D. Driver and M. Kanda, "An optically linked electric and magnetic field sensor for poynting vector measurements in the near-fields of radiating sources," IEEE Trans. Electromag. Compat., vol. 30, pp. 495-505, Nov. 1988.
    • IEEE Trans. Electromag. Compat., Vol. 30, Pp. 495-505, Nov. 1988.
    • Driver, L.D.1    Kanda, M.2
  • 37
    • 35848964685 scopus 로고    scopus 로고
    • "Electromagnetic field in the vicinity of low voltage ESD wave source: Unipolarity and ultra-wide band,"
    • "Electromagnetic field in the vicinity of low voltage ESD wave source: unipolarity and ultra-wide band," in Proc. EOS/ESD Symp., EOS-12, Lake Buena Vista, FL, 1990, pp. 107-110.
    • In Proc. EOS/ESD Symp., EOS-12, Lake Buena Vista, FL, 1990, Pp. 107-110.
  • 48
    • 35848931343 scopus 로고    scopus 로고
    • "Optoelectronics designer's catalogue,"
    • Hewlett-Packard Company, "Optoelectronics designer's catalogue," 1993.
    • 1993.
    • Company, H.-P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.