Use of a semiconductor detector for measurement of high energy end loss ions from a tandem mirror

Review of Scientific Instruments

Volumn 68, Issue 3, 1997, Pages 1433-1437

  Saito, T ^a   Sakakibara, M ^a   Kiwamoto, Y ^a   Tatematsu, Y ^a   Yoshimura, Y ^a   Ichimura, M ^a   Tamano, T ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM FOIL; CALIBRATION; ELECTRON SCATTERING; ELECTRONS; IONS; MAGNETIC FIELDS; MIRRORS; PROTONS; SEMICONDUCTING SILICON;

COULOMB COLLISIONS; ENERGY SPECTRUM; HIGH ENERGY END LOSS IONS; ION CYCLOTRON WAVES; PASSIVATED IMPLANTED PLANAR SILICON DETECTOR; PITCH ANGLE; PULSE HEIGHT ANALYZER; SILICON SURFACE BARRIER DETECTOR;

PARTICLE DETECTORS;

EID: 0031100932     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147629     Document Type: Article

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