Electrodeposition of quantum-confined metal/semiconductor nanocomposites

Advanced Materials

Volumn 9, Issue 4, 1997, Pages 334-338

  Switzer, Jay A ^a   Hung, Chen Jen ^a   Bohannan, Eric W ^a   Shumsky, Mark G ^a   Golden, Teresa D ^a   Van Aken, David C ^a  

^a MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; COPPER; COPPER OXIDES; CURRENT DENSITY; ELECTRODEPOSITION; OPTICAL PROPERTIES; PHASE COMPOSITION; SEMICONDUCTING FILMS; SEMICONDUCTOR QUANTUM DOTS;

CATHODIC CURRENT DENSITY; NANOCOMPOSITE FILMS; QUANTUM CONFINEMENT;

NANOSTRUCTURED MATERIALS;

EID: 0031100866     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.19970090411     Document Type: Article

References (32)

1. M. J. Kelly, Low-Dimensional Semiconductors, Oxford University Press, Oxford 1995.
2. Z. H. Lu, D. J. Lockwood, J.-M. Baribeau, Nature 1995, 378, 258.
3. A. P. Alivisatos, Science 1996, 271, 933.
4. L. Brus, Appl. Phys. A 1991, 53, 465.
5. C. B. Murray, C. R. Kagan, M. G. Bawendi, Science 1995, 270, 1335.
6. T. Vossmeyer, L. Katsikas, M. Giersig, I. G. Popovic, K. Diesner, A. Chemseddine, A. Eychmüller, H. Weller, J. Phys. Chem. 1994, 98, 7665.
7. E. J. Heller, M. F. Crommie, C. P. Lutz, D. M. Eigler, Nature 1994, 369, 464.
8. L. O. Grondahl, Science 1926, 64, 306.
9. C. Kittel, Introduction to Solid State Physics, 6th ed., Wiley, New York 1986, Ch. 11.
10. P. W. Baumeister, Phys. Rev. 1961, 121, 359.
11. D. Fröhlich, R. Kenklies, C. Uihlein, C. Schwab, Phys. Rev. Lett. 1979, 43, 1260.
12. V. T. Agekyan, Phys. Status Solidi A 1977, 43, 11.
13. J. L. Lin, J. P. Wolfe, Phys. Rev. Lett. 1993, 71, 1222.
14. A. Mysyrowicz, E. Benson, E. Fortin, Phys. Rev. Lett. 1996, 77, 896.
15. D. Snoke, Science 1996, 273, 1351.
16. A. Kellersohn, E. Knözinger, W. Langel, M. Giersig, Adv. Mater. 1995, 7, 652.
17. C. R. Martin. Science 1994, 266, 1961.
18. Y. Golan, L. Margulis, G. Hodes, I. Rubinstein, J. L. Hutchison, Surf. Sci. 1994, 311, L633.
19. J. A. Switzer, M. J. Shane, R. J. Phillips, Science 1990, 247, 444.
20. J. A. Switzer, T. D. Golden, Adv. Mater. 1993, 5, 474.
21. J. A. Switzer, R. P. Raffaelle, R. J. Phillips, C.-J. Hung, T. D. Golden, Science 1992, 258, 1918.
22. J. A. Switzer, R. J. Phillips, T. D. Golden, Appl. Phys. Lett. 1995, 66, 819.
23. J. A. Switzer, C.-J. Hung, B. E. Breyfogle, M. G. Shumsky, R. Van Leeuwen, T. D. Golden, Science 1994, 264, 1573.
24. R. A. Van Leeuwen, C.-J. Hung, D. R. Kammler, J. A. Switzer, J. Phys. Chem. 1995, 99, 15247.
25. A. E. Rakhshani, Solid-State Electron. 1986, 29, 7.
26. T. D. Golden, M. G. Shumsky, Y. Zhou, R. A. VanderWerf, R. A. Van Leeuwen, J. A. Switzer, Chem. Mater. 1996, 8, 2499.
27. B. Rush, J. Newman, J. Electrochem. Soc. 1995, 142, 3770.
28. W. Wolf, K. Krischer, M. Lübke, M. Eiswirth, G. Ertl, J. Electroanal. Chem. 1995, 385, 85.
29. H. D. Dewald, P. Rarmananda, R. W. Rollins, J. Electrochem. Soc. 1993, 140, 1969.
30. R. A. Young, in The Rietveld Method (Ed: R. A. Young), Oxford University Press, Oxford 1995, Ch. 1.
31. H. P. Klug, L. E. Alexander, X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed., Wiley, New York 1974, p.656.
32. Y. Kayanuma, Phys. Rev. B 1988, 58, 9797.