Preparation and characterization of MOCVD thin films of zinc sulphide

Optical Materials

Volumn 7, Issue 3, 1997, Pages 109-115

  Osasona, O ^a   Djebah, A ^a   Ojo, I A O ^a   Eleruja, M A ^a   Adedeji, A V ^a   Jeynes, C ^b   Ajayi, E O B ^a  

^a OBAFEMI AWOLOWO UNIVERSITY   (Nigeria)

^b UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; COMPOSITION; DEPOSITION; EMISSION SPECTROSCOPY; INFRARED SPECTROSCOPY; PYROLYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STOICHIOMETRY; THICKNESS MEASUREMENT; X RAY SPECTROSCOPY; ZINC SULFIDE;

ENERGY DISPERSIVE X RAY FLUORESCENCE (EDXRF) SPECTROSCOPY; THIN SOLID FILMS;

THIN FILMS;

EID: 0031100757     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-3467(96)00065-1     Document Type: Article

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