Exact coupled-mode theories for multilayer interference coatings with arbitrary strong index modulations

IEEE Journal of Quantum Electronics

Volumn 33, Issue 3, 1997, Pages 295-302

  Matuschek, Nicolai ^a,c   Kärtner, Franz X ^a,d,e,f,g   Keller, Ursula ^{a,b,h,i,j,k,l,m}  

^a ETH ZURICH   (Switzerland)

^b IEEE

^c UNIVERSITY OF ULM   (Germany)

^d TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^e MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^f German Physical Society   (Germany)

^g OPTICAL SOCIETY OF AMERICA   (United States)

^h STANFORD UNIVERSITY   (United States)

ⁱ HERIOT WATT UNIVERSITY   (United Kingdom)

^j LUCENT TECHNOLOGIES   (United States)

^k European Physical Society   (Finland)

^l Swiss Physical Society   (Switzerland)

^m Swiss Academy of Technical Sciences   (Switzerland)

more..

Author keywords

Coatings; Coupled mode analysis; Coupled transmission lines; Dielectric films; Electromagnetic coupling; Thin film devices; Transmission line theory

Indexed keywords

COUPLED MODE ANALYSIS; COUPLING COEFFICIENTS; DETUNING COEFFICIENTS; ELECTROMAGNETIC COUPLINGS;

DIELECTRIC FILMS; DIFFRACTION GRATINGS; LIGHT INTERFERENCE; LIGHT MODULATION; LIGHT MODULATORS; NUMERICAL METHODS; OPTICAL COATINGS; REFRACTIVE INDEX; SEMICONDUCTOR DEVICE STRUCTURES; THIN FILM DEVICES; TRANSMISSION LINE THEORY;

MIRRORS;

EID: 0031100360     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.555995     Document Type: Article

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