-
1
-
-
0029229659
-
An investigation of conductive polymer flip chip attachments in multichip module applications
-
C. Howard, S. Nair, S. Ang, and L. Schaper, "An investigation of conductive polymer flip chip attachments in multichip module applications," in Proc. 45th Electron. Comp. Technol. Conf., 1995, pp. 1244-1249.
-
(1995)
Proc. 45th Electron. Comp. Technol. Conf.
, pp. 1244-1249
-
-
Howard, C.1
Nair, S.2
Ang, S.3
Schaper, L.4
-
2
-
-
0027310002
-
Processing, structural and electrical properties of electrically conductive adhesives
-
H. Kim, L. Li, C. Luzzul, I. Sacollck, and J. E. Morris, "Processing, structural and electrical properties of electrically conductive adhesives," in Proc. 45th Electron. Comp. Technol. Conf., 1993, pp. 311-319.
-
(1993)
Proc. 45th Electron. Comp. Technol. Conf.
, pp. 311-319
-
-
Kim, H.1
Li, L.2
Luzzul, C.3
Sacollck, I.4
Morris, J.E.5
-
3
-
-
0029239503
-
Area bonding conductive (ABC) adhesives for flex circuit connection to LTCC/MCM substrates
-
J. C. Bolger, M. Reynolds, and J. Popielarczyk, "Area bonding conductive (ABC) adhesives for flex circuit connection to LTCC/MCM substrates," in Proc. 45th Electron. Comp. Technol. Conf., 1995, pp. 529-533.
-
(1995)
Proc. 45th Electron. Comp. Technol. Conf.
, pp. 529-533
-
-
Bolger, J.C.1
Reynolds, M.2
Popielarczyk, J.3
-
4
-
-
0027841481
-
Electrical, structural, and processing properties of electrically conductive adhesives
-
Dec.
-
L. Li, C. Lizzul, H. Kim, I. Sacolick, and J. Morris, "Electrical, structural, and processing properties of electrically conductive adhesives," IEEE Trans. Comp. Hybrids, Manufact. Technol., vol. 16, pp. 843-851, Dec. 1993.
-
(1993)
IEEE Trans. Comp. Hybrids, Manufact. Technol.
, vol.16
, pp. 843-851
-
-
Li, L.1
Lizzul, C.2
Kim, H.3
Sacolick, I.4
Morris, J.5
-
5
-
-
0029229086
-
A novel method of measuring microelectronic interconnect transmission line parameters and discontinuity equivalent electrical parameters using multiple reflections
-
C. E. Abernathy, A. C. Cangellaris, and J. L. Prince, "A novel method of measuring microelectronic interconnect transmission line parameters and discontinuity equivalent electrical parameters using multiple reflections," in Proc. 45th Electron. Comp. Technol. Conf., 1995, pp. 329-336.
-
(1995)
Proc. 45th Electron. Comp. Technol. Conf.
, pp. 329-336
-
-
Abernathy, C.E.1
Cangellaris, A.C.2
Prince, J.L.3
-
9
-
-
0026388087
-
Microwave properties of ceramic materials
-
May
-
D. I. Amey and J. P. Curilla, "Microwave properties of ceramic materials," in Proc. 41st IEEE ECTC, May 1991, pp. 267-272.
-
(1991)
Proc. 41st IEEE ECTC
, pp. 267-272
-
-
Amey, D.I.1
Curilla, J.P.2
-
10
-
-
0027037355
-
The electrical characterization of multichip module materials
-
Baltimore, MD, June
-
D. I. Amey, J. P. Curilla, and D. Gates, "The electrical characterization of multichip module materials," in 6th Int. Electron. Conf., Soc. Advancement of Material and Process Eng. (SAMPE), Baltimore, MD, June 1992, pp. 485-499.
-
(1992)
6th Int. Electron. Conf., Soc. Advancement of Material and Process Eng. (SAMPE)
, pp. 485-499
-
-
Amey, D.I.1
Curilla, J.P.2
Gates, D.3
-
11
-
-
0000949842
-
Losses in microstrip
-
R. Pucel, K. Massé, and C. P. Hartwig, "Losses in microstrip," IEEE Trans. Microwave Theory Technol., vol. 16, pp. 342-350, 1968.
-
(1968)
IEEE Trans. Microwave Theory Technol.
, vol.16
, pp. 342-350
-
-
Pucel, R.1
Massé, K.2
Hartwig, C.P.3
-
12
-
-
0025491759
-
The current distribution and AC resistance of a microstrip structure
-
Sept.
-
R. Faraji-Dana and Y. L. Chow, "The current distribution and AC resistance of a microstrip structure," IEEE Trans. Microwave Theory Technol., vol. 38, pp. 1268-1277, Sept. 1990.
-
(1990)
IEEE Trans. Microwave Theory Technol.
, vol.38
, pp. 1268-1277
-
-
Faraji-Dana, R.1
Chow, Y.L.2
-
13
-
-
0028429206
-
Effects of losses on signals in PWB's
-
May
-
R. Evans, "Effects of losses on signals in PWB's," IEEE Trans. Comp., Packag., Manufact. Technol., vol. 17, pp. 217-222, May 1994.
-
(1994)
IEEE Trans. Comp., Packag., Manufact. Technol.
, vol.17
, pp. 217-222
-
-
Evans, R.1
|