Angle-resolved X-ray photoelectron spectroscopy (ARXPS) study of substitution effects in Sb2Te3-xSex crystals and their influence on density of antisite defects

Solid State Ionics

Volumn 95, Issue 3-4, 1997, Pages 315-321

  Bastl, Z ^a   Spirovova I ^a   Horak J ^b  

^a J HEYROVSKÝ INSTITUTE OF PHYSICAL CHEMISTRY   (Czech Republic)

^b INSTITUTE OF MATHEMATICS   (Czech Republic)

Author keywords

Angle resolved X ray photoelectron spectroscopy; Antimony telluride; Antisite defects; Substitution effects

Indexed keywords

CRYSTAL LATTICES; REACTION KINETICS; SELENIUM; SUBSTITUTION REACTIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANTIMONY TELLURIDE; ANTISITE DEFECTS;

CRYSTALS;

EID: 0031099713     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0167-2738(96)00589-9     Document Type: Article

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