Microwave surface resistance peak at Tc in Bi2Sr2CaCu2O8+x film

Physica C: Superconductivity and its Applications

Volumn 276, Issue 1-2, 1997, Pages 84-90

  Silva, E ^a   Lanucara, M ^b   Marcon, R ^a  

^a ROMA TRE UNIVERSITY   (Italy)

^b UNIVERSITÀ DI ROMA LA SAPIENZA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; COMPOSITION EFFECTS; FREQUENCIES; HIGH TEMPERATURE SUPERCONDUCTORS; MATHEMATICAL MODELS; OXIDE SUPERCONDUCTORS; SUBSTRATES; SUPERCONDUCTING TRANSITION TEMPERATURE; SUPERCONDUCTIVITY; THERMAL EFFECTS;

BISMUTH STRONTIUM CALCIUM COPPER OXIDE; MICROWAVE SURFACE RESISTANCE; TWO FLUID MODELS;

SUPERCONDUCTING FILMS;

EID: 0031099591     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(97)00022-1     Document Type: Article

References (34)

1. M.A. Manheimer, S. Lofland, A. Gould, S.M. Bhagat, B. Halsey, M.S. Green and S. Tyagi, Physica C 183 (1991) 324.
2. M. Poirier, G. Quirion, B. Quirion, F. D'Arazio, J.P. Thiel, W.P. Halperin and K.R. Poeppelmeier, J. Appl. Phys. 66 (1989) 1261.
3. S.E. Lofland, S.B. Ogale, M. Rajeswari, D.D. Chougule, S.M. Bhagat and T. Venkatesan, IEEE Trans. Appl. Supercond. 5 (1995) 1741.
4. S.E. Lofland, M. Dominguez, S.D. Tyagi, S.M. Bhagat, M.C. Robson, C. Kwon, Z. Trajanovic, I. Takeuchi, R. Ramesh and T. Venkatesan, Thin Solid Films, in press (1996).
5. S.E. Lofland, B. Ratnam, S.M. Bhagat, I. Takeuchi, Z. Trajanovic, P. Warburton, T. Venkatesan, Sol. State Commun. 94 (1995) 471.
6. E.J. Pakulis and S.E. Blum, Appl. Phys. Lett. 57 (1990) 1464.
7. N. Exon, M. Lancaster, A. Porch, G. Yang and C.E. Gough, IEEE Trans. Appl. Supercond. 3 (1993) 1442.
8. C.E. Gough and N.J. Exon, Phys. Rev. B 50 (1994) 488.
9. S. Oxx, B.A. Willemsen, Q. Li, K. Shibutani, I. Shigaki, R. Ogawa and S. Sridhar, Physica C 235-240 (1994) 889.
10. M.C. Nuss, P.M. Mankiewich, M.L. O'Malley and E.H. Westerwick, Phys. Rev. Lett. 66 (1991) 3305.
11. K. Holczer, L. Forro, L. Mihaly and G. Grüner, Phys. Rev. Lett. 67 (1991) 152.
12. O. Klein, K. Holczer and G. Grüner, Phys. Rev. Lett. 68 (1992) 2407.
13. T. Shibauchi, A. Maeda, H. Kitano, T. Honda and K. Uchinokura Physica C 203 (1992) 315.
14. M.L. Horbach, W. van Sarloos and D.A. Huse, Phys. Rev. Lett. 67 (1991) 3464.
15. H.K. Olsson and R.H. Koch, Phys. Rev. Lett. 68 (1992) 2406.
16. I. Ciccarello, C. Fazio, M. Guccione and M.Li Vigni, Annal. Phys. 3 (1994) 13; A. Agliolo Gallitto, I. Ciccarello, M. Guccione and M.Li Vigni, Physics Lett. A 187 (1994) 97.
17. I. Ciccarello, C. Fazio, M. Guccione and M.Li Vigni, Annal. Phys. 3 (1994) 13; A. Agliolo Gallitto, I. Ciccarello, M. Guccione and M.Li Vigni, Physics Lett. A 187 (1994) 97.
18. E. Silva, M. Lanucara and R. Marcon, Supercond. Sci. Technol. 9 (1996) 934.
19. P. Wagner, H. Adrian, and C. Tomé-Rosa, Physica C 195 (1992) 258.
20. R. Fastampa, M. Giura, R. Marcon and E. Silva, Meas. Sol. Technol. 1 (1990) 1172.
21. See, e.g., C.P. Poole, Electron Spin Resonance (Interscience, Wiley, New York, 1967).
22. E. Silva and M. Lanucara et al., unpublished.
23. E. Silva, R. Marcon and F.C. Matacotta, Physica C 218 (1993) 109.
24. 0 essentially as a fitting parameter.
25. N. Klein, H. Chaloupka, G. Müller, S. Orbach, H. Piel, B. Roas, L. Schultz, U. Klein and M. Peiniger, J. Appl. Phys. 67 (1990) 6940; L. Drabeck, K. Holczer, G. Grüner and D.J. Scalapino, J. Appl. Phys. 68 (1990) 892; P. Hartemann, IEEE Trans. Appl. Supercond. 2 (1992) 228.
26. N. Klein, H. Chaloupka, G. Müller, S. Orbach, H. Piel, B. Roas, L. Schultz, U. Klein and M. Peiniger, J. Appl. Phys. 67 (1990) 6940; L. Drabeck, K. Holczer, G. Grüner and D.J. Scalapino, J. Appl. Phys. 68 (1990) 892; P. Hartemann, IEEE Trans. Appl. Supercond. 2 (1992) 228.
27. N. Klein, H. Chaloupka, G. Müller, S. Orbach, H. Piel, B. Roas, L. Schultz, U. Klein and M. Peiniger, J. Appl. Phys. 67 (1990) 6940; L. Drabeck, K. Holczer, G. Grüner and D.J. Scalapino, J. Appl. Phys. 68 (1990) 892; P. Hartemann, IEEE Trans. Appl. Supercond. 2 (1992) 228.
28. J. Ceremuga, J. Krupka, T. Kosciuk, J. Supercond. 8 (1995) 681.
29. peak.
30. A. Dulcic, H. Crepeau, J.H. Freed, L.F. Chneemeyer and J.V. Waszczak, Phys. Rev. B 42 (1990) 2155.
31. Due to the deposition procedure, the film is expected to be more homogeneous in the center than at the edges: P. Wagner, private communication.
32. All material parameters: P. Wagner, private communication.
33. For a recent review on the dielectric properties of several HTC substrates, see: E.K. Hollmann, O.G. Vendik, A.G. Zaitsev and B.T. Melekh, Supercond. Sci. Technol. 7 (1994) 609.
34. W.-H. Yang, D.-S. Hou, C.-Z. Li, H. Fan and H.Y. Zhang, Solid State Commun. 75 (1990) 421.