Use of He(I) 447.1-nm line with forbidden component for electron density determination in plasmas

Applied Spectroscopy

Volumn 51, Issue 3, 1997, Pages 396-400

  Mijatovic Z ^a   Kobilarov, R ^a   Djurovic S ^a   Stevanov, M ^a  

^a Institute of Physics

Author keywords

Electron density; Forbidden component; Plasma diagnostics; Plasma spectroscopy

Indexed keywords

CARBON DIOXIDE LASERS; CARRIER CONCENTRATION; ELECTRON DENSITY MEASUREMENT; HELIUM; INTERFEROMETERS; PLASMA DIAGNOSTICS; PLASMA SOURCES;

FORBIDDEN COMPONENTS; PLASMA SPECTROSCOPY;

PLASMA DENSITY;

EID: 0031099458     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702981940269     Document Type: Article

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