Time-of-flight study of the compensation mechanism in a-Se alloys

Journal of Imaging Science and Technology

Volumn 41, Issue 2, 1997, Pages 135-142

  Pai, D M ^a  

^a XEROX CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC; CHLORINE; ELECTRIC CURRENTS; ELECTRON TRANSPORT PROPERTIES; LIGHT SENSITIVE MATERIALS; PHOTOSENSITIVITY; SELENIUM; SUBSTRATES;

AMORPHOUS SELENIUM ALLOYS;

AMORPHOUS ALLOYS;

EID: 0031099433     PISSN: 10623701     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)

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