X-ray powder diffraction pattern of Bi4(SiO4)3

Journal of Materials Science and Technology

Volumn 13, Issue 2, 1997, Pages 145-148

  Liu, Hongchao ^a   Kuo, Changlin ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; X RAY DIFFRACTION ANALYSIS;

RIETVELD ANALYSIS; X RAY POWDER DIFFRACTION;

BISMUTH COMPOUNDS;

EID: 0031099123     PISSN: 10050302     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

1. Durif-Varambon: Bull. Soc. Franc. Min. Crist., 1959, 82, 285.
2. R.Perret: private communication, 1983.
3. C.Roob and G.J.McCarthy: North Dakota State University, USA, ICDD Grant-in-aid Report, 1980.
4. D.J.Segal, R.P.Santoro and R.E.Newnham: Z.Kristallogr., 1966, 123, 73.
5. H.M.A.Rietveld: J. Appl. Cryst., 1969, 2, 65.
6. R.A.Young, A.Sakthivel, T.S.Moss and C.O.Paviasantos: Program DBWS9411 for Rietveld Analysis of X-ray & Neutron Powder Diffraction Patterns, Georgia Institute of Technology, USA, 1995.
7. G.S.Smith and R.L.Snyder: J.Appl. Cryst. 1979, 12, 60.
8. G.J.McCarthy: private communication, 1995.
9. G.J.McCarthy and J.M.Welton: Powder Diffraction, 1989, 4, 156.
10. C.K.Lowe Ma: Powder Diffraction, 1991, 6, 31.