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Volumn 374, Issue 1-3, 1997, Pages 104-116

Surface alloy formation and interdiffusion in (√5 × √5)R27°-Yb/Al(001): A combined low-energy electron diffraction and x-ray photoelectron diffraction study

Author keywords

Aluminum; Chemisorption; Low energy electron diffraction (LEED); Low index single crystal surfaces; Metal metal interfaces; Photoelectron diffraction; Surface relaxation and reconstruction; Ytterbium

Indexed keywords

ALUMINUM; ATOMS; CRYSTAL ATOMIC STRUCTURE; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; YTTERBIUM;

EID: 0031098935     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01187-9     Document Type: Article
Times cited : (14)

References (35)
  • 2
    • 0021585826 scopus 로고
    • Ed. S.G. Davison Pergamon, New York
    • C.S. Fadley, in: Progress in Surface Science, Vol. 16, Ed. S.G. Davison (Pergamon, New York, 1984) p. 275; C.S. Fadley, in: Synchrotron Radiation Research: Advances in Surface Science, Ed. R.Z. Bachrach (Plenum, New York, 1990) ch. 11.
    • (1984) Progress in Surface Science , vol.16 , pp. 275
    • Fadley, C.S.1
  • 3
    • 0021585826 scopus 로고
    • Ed. R.Z. Bachrach Plenum, New York, ch. 11
    • C.S. Fadley, in: Progress in Surface Science, Vol. 16, Ed. S.G. Davison (Pergamon, New York, 1984) p. 275; C.S. Fadley, in: Synchrotron Radiation Research: Advances in Surface Science, Ed. R.Z. Bachrach (Plenum, New York, 1990) ch. 11.
    • (1990) Synchrotron Radiation Research: Advances in Surface Science
    • Fadley, C.S.1
  • 25
    • 0043117471 scopus 로고    scopus 로고
    • MP used in the present XPD study. The errors indicated for the structural parameters determined from the XPD data are estimates.
    • MP used in the present XPD study. The errors indicated for the structural parameters determined from the XPD data are estimates.
  • 28
    • 0043117473 scopus 로고    scopus 로고
    • note
    • 0=3 eV. In all the calculations shown, these optimum values have been used. For a discussion of the reasons underlying these relatively low values, see Ref. [14].
  • 32
    • 0041614640 scopus 로고
    • Diploma Thesis, Université de Fribourg
    • R. Fasel, Diploma Thesis, Université de Fribourg, 1991.
    • (1991)
    • Fasel, R.1
  • 35
    • 0041614639 scopus 로고
    • T. Greber et al., J. Phys. 48 C9 (1987) 943.
    • (1987) J. Phys. , vol.48 , Issue.C9 , pp. 943
    • Greber, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.