State-selective electron capture by Si4+ from D in a merged-beams apparatus

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 30, Issue 6, 1997, Pages

  Wu, W ^a   Havener, C C ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEUTERIUM; ELECTRON BEAMS; ELECTRON ENERGY ANALYZERS; ELECTRON ENERGY LEVELS; ION BEAMS; SILICON;

STATE SELECTIVE ELECTRON CAPTURE;

ELECTRON ABSORPTION;

EID: 0031098893     PISSN: 09534075     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-4075/30/6/005     Document Type: Article

References (21)