Correction for system compliance during point-loading of thin brittle films

Experimental Techniques

Volumn 21, Issue 2, 1997, Pages 28-31

  Liu, C ^a   Case, E D ^b  

^a Optical Imaging Systems   (United States)

^b MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELASTIC MODULI; HARDNESS; LOADS (FORCES); MATERIALS TESTING; MATHEMATICAL MODELS; PLASTICITY; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; SYNTHETIC DIAMONDS;

NANOINDENTERS; OFF CENTER POINT LOADING; POINT LOAD DEFLECTION TESTING;

THIN FILMS;

EID: 0031098743     PISSN: 07328818     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1747-1567.1997.tb00506.x     Document Type: Article

References (13)

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